Method of etching copper or copper-doped aluminum

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438688, 438720, 438754, 216 2, 216 13, 216 67, 216 77, 216 78, 216 66, H01L 2144

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active

059982977

ABSTRACT:
An embodiment of the instant invention is a method of etching a conductive structure comprised of copper and overlying a semiconductor substrate, the method comprising the step of: subjecting the conductive structure to a combination of plasma, an etchant, and a gaseous aluminum source. Preferably, the conductive structure is comprised of aluminum and copper (more preferably, it is comprised of aluminum and 1 to 4% by weight copper) or it may be substantially comprised of substantially pure copper. In addition, the etchant is preferably introduced into the process chamber in a gaseous state and is comprised of Cl.sub.2. The gaseous aluminum source may be comprised of: DMAH, trimethylaluminum, dimethylalane, trimethylaminealine, dimethylethylaminealane, dimethylethylaminedimethylalane, or AlCl.sub.3.

REFERENCES:
patent: 4468284 (1984-08-01), Nelson
patent: 4919750 (1990-04-01), Bausmith
Sato, et al., "Al-Cu Alloy Etching Using In-Reactor Aluminum Chloride Formation in Statci Mandetron Triode Reactive Ion Etching," Jpn. J. Appl. Phys., vol. 32(1993), pp. 3013-3018.
Narasimhan et al., "Aluminum-4% Cu Interconnect Etching in a Low-Pressure Magnetically Enhanced Reactor", vol. 10, No. 4, Jul./Aug. 1992, pp. 1100-1105.
Sato et al., "Al-Cu Alloy Etching Using In-reactor Aluminum Chloride Formation in Static Magnetron Triode Reactive Ion Etching", Jpn. J. Appl. Phys. vol. 32 Pt. 1, No. 6B, 1993, pp. 3013-3018.
F. P. Emmenegger, "Stability of Gaseous Complexes between Two-and Three-Valent Metal Halides", Inorganic Chemistry, vol. 16, No. 2, 1977, pp. 343-348.

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