SPM cantilever and a method for manufacturing the same

Radiant energy – Inspection of solids or liquids by charged particles

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25022726, 250234, 73105, G01B 528

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active

058833870

ABSTRACT:
An SPM cantilever comprises a cantilever portion shaped as a thin plate and extending between a proximal end and a free end, a supporting portion attached to one surface of the cantilever portion on a side of the proximal end, and a probe projecting from the other surface of the cantilever portion on a side of the free end of the cantilever portion the supporting member, and the cantilever portion and the probe are made of different materials.

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T.R. Albrecht et al; "Atomic Resolution Imaging of a Nonconductor By Atomic Force Microscopy"; Oct. 1, 1987; pp. 2599-2602; J. Appl. Phys., vol. 62; No. 7.
Applied Physics Letters, vol. 62, Feb. 1, 1993, No. 5 N.F. van Hulst et al, Near-Field Optical Microscope Using a Silicon-Nitride Probe.
Journal of Vacuum Science & Technology B, Second Series, vol. 9, No. 2, Part II, Mar./Apr., 1991, O. Wolter, et al, Micromachined Silicon Sensors for Scanning Force Microscopy.

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