Method of analyzing semiconductor device operation, method of an

Details Method of analyzing semiconductor device operation, method of an Method of analyzing semiconductor device operation, method of an

1992-11-30

2000-03-21

Meky, Moustafa M.

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

G06F 1750

Patent

active

060414243

ABSTRACT:
A method of analyzing the operation of a semiconductor device by solving simultaneous equations consisting of electron- and hole-transport equations and Poisson's equation, by means of a computer, thereby to accomplish the modeling of the semiconductor device. The method comprises the steps of: rewriting simultaneous equations to the following equations (a), (b), (c) containing artificial time differential terms dp/dt, dn/dt, d.psi./dt and sensitivity coefficients .lambda.p, .lambda.n, and .lambda..psi.:

REFERENCES:
patent: 4734879 (1988-03-01), Lin et al.
patent: 4791593 (1988-12-01), Hennion
patent: 4918643 (1990-04-01), Wong
patent: 4939681 (1990-07-01), Yokomizo et al.
IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems, vol. 8, No. 5, May 1989, pp. 528-537, Ke-Chih Wu, et al., "New Approaches in a 3-D One-Carrier Device Solver".
The 2nd Symposium on the Frontiers of Massively Parallel Computation, Oct. 10-12, 1988, pp. 289-294, J.P. Darling, et al., "Parallel Algorithm for the Solution of Nonlinear Poisson Equation of Semiconductor Device Theory and its Implementation on the MPP".
Philips Journal of Research, vol. 42, No. 5-6, Dec. 1987, pp. 533-565, S.C. Hu, et al., "Computer-Aided Design of Semiconductor Processes and Devices".
Device Electronics for integrated Circuits, by Muller and Kamins, John Wiley and Sons 1977, pp. 152-181.
M. Kurata, "Numerical Analysis for Semiconductor Devices", D.C. Heath and Company, 1982, Chapter 7, Appendix G & Appendix H.
G.A. Bekey and W.J. Karplus, "Hybrid Computation", John Wiley & Sons, Inc., 1968. Section 9.4 Optimization by continous steepest descent.
W. Jeffrey and R. Rosner, "Optimization Algorithms: Simulated Annealing and Neural Network Processing," The Astrophysical Journal, 310, pp. 473-481, 1986, Nov. 1.
J. Hopfield, "Artificial Neural Networks", IEEE Circuits and Devices Magazine, pp. 3-10, Sep., 1988.
"Further improved algorithm for the solution of the nonlinear Poisson equation in semiconductor devices." --G.J.L. Ouwerling; J. Appl. Phys. 66 (12), Dec. 15, 1989; pp. 6144-6149.
"Fast algorithm for iteratively solving the nonlinear static Poisson equation in semiconductors."-W.W. Keller; J.Appl. Phys. 61 (11), Jun. 1, 1987; pp. 5189-5190.
"Solution of the nonlinear Poisson equation of semiconductor device theory." --I.D. Mayergoyz; J. Appl. Phys. 59 (1), Jan. 1, 1986; pp. 195-199.
Device Electronics For Integrated Circuits, Richard S. Muller, Theodore I. Kamins, Wiley 1997, pp. 105-123.
Practical Numerical Analysis, G.A. Evans, Wiley 1995, pp. 320-330.

Affiliated with

Also associated with

Rating

Method of analyzing semiconductor device operation, method of an does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of analyzing semiconductor device operation, method of an, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of analyzing semiconductor device operation, method of an will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-738986