Circuit and method for varying a period of an internal control s

Details Circuit and method for varying a period of an internal control s Circuit and method for varying a period of an internal control s

1996-06-14

1998-11-03

Nguyen, Viet Q.

Static information storage and retrieval

Read/write circuit

Testing

365233, 371 211, G11C 2900

Patent

active

058319182

ABSTRACT:
The invention is a dynamic random access memory (DRAM) device having an electronic test key fabricated on board and is a method for testing the DRAM. The electronic test key generates a signal which effects a variation in a period of an internal control signal to stress the DRAM during a test mode.

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