Resist material

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

G03F 7038, G03F 7039

Patent

active

056655193

ABSTRACT:
A vertically orienting compound is added to a chemical amplification type resist to progress acid catalysis during baking after exposure and penetration of a developer in a developing step in the direction of depth of the resist. This improves the resist shape, the dimensional uniformity, and the resolving power in a lithography step.

REFERENCES:
patent: 4983479 (1991-01-01), Broer et al.
patent: 4996123 (1991-02-01), Nomura et al.
J.W. Thackeray et al., "Deep UV ANR Photoresists For 248 nm Excimer Laser Photolithography", SPIE vol. 1086 Advances in Resist Technology and Processing VI (1989), pp. 34-47.
C.G. Willson et al., "Approaches to the Design of . . . Improved Sensitivity and Resolution", J. Electrochem. Soc.: Solid-State Science and Technology, vol. 133, No. 1, Jan. 1986, pp. 181-187.
H. Ito et al., "Applications of Photoinitiators to the Design of Resists for Semiconductor Manufacturing", Polymers in Electronics, 1983, pp. 11-23.
R.A.M. Hikmet et al., Polymer, 1993, vol. 34, No. 8, pp. 1736-1740. No month given.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Resist material does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Resist material, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Resist material will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-68568

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.