Method for forming metal line of semiconductor device

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438622, 438637, 438627, 438672, H01L 2144

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active

060966467

ABSTRACT:
A method for forming metal line of a semiconductor device in which, if the aspect ratio of the contact holes is big, contact holes are buried with a CVD method using the HDP method, and the line process is simplified to improve the reliability is disclosed, including the steps of forming an insulating film having a contact hole on a semiconductor substrate; forming a barrier metal layer on the insulating film including the contact hole; and forming a metal line layer on the barrier metal layer with a CVD method using a high density plasma.

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Gross, M.E., et al, Liquid Source Metalorganic Chemical Vapor Deposition of Aluminum From Triethylamine Alane, J. Appl. Phys. 69 (4), Feb. 15, 1991, pp. 2589-2592.

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