SOI semiconductor device with low concentration of electric fiel

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257353, 257354, 257401, 257406, 257411, 257618, 257623, 438 29, 438 34, H01L 2701, H01L 2976, H01L 2906, H01L 21265

Patent

active

057395748

ABSTRACT:
A semiconductor device which includes a mesa type silicon film with a source/drain region and a channel region formed therein, a gate oxide film formed on the mesa type silicon film, and a gate electrode provided on the mesa type silicon film through the gate oxide film, wherein an oxide film having a thickness greater than that of the gate film is formed at the top edge section of the mesa type silicon which is present under the gate electrode, as well as a method for manufacturing it.

REFERENCES:
patent: 3690968 (1972-09-01), Fa et al.
patent: 3974515 (1976-08-01), Ipri et al.
patent: 4729006 (1988-03-01), Dally et al.
patent: 4983535 (1991-01-01), Blanchard
patent: 5060035 (1991-10-01), Nishimura et al.
patent: 5340999 (1994-08-01), Takeda et al.
patent: 5381029 (1995-01-01), Eguchi et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

SOI semiconductor device with low concentration of electric fiel does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with SOI semiconductor device with low concentration of electric fiel, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and SOI semiconductor device with low concentration of electric fiel will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-637788

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.