Method for dose calculation of photolithography projection print

Radiation imagery chemistry: process – composition – or product th – Including control feature responsive to a test or measurement

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355 77, 356 51, 430142, 430327, G03C 518, G03C 516, G03C 508, G03F 720

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active

044748647

ABSTRACT:
A process for setting the exposure speed of photolithography instruments is described, using a method of dosimetry based on photoactive compound bleaching of photoresist. A curve of light absorbance to exposure speed and a calibration curve of light absorbance to dose are determined for a photoresist. The exposure speed for any desired degree of resist bleaching can be set using the first curve, and the exposure speed for a predetermined dosage can be set by determining the common light absorbance value on the exposure speed and dosage curves.

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patent: 4128338 (1978-12-01), Wong
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