Projection exposure apparatus having an off-axis alignment syste

Radiant energy – Photocells; circuits and apparatus – Photocell controls its own optical systems

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356401, G01N 2186

Patent

active

052431959

ABSTRACT:
An exposure apparatus for exposing mask patterns on a sensitive plate comprises a set (for X and Y direction) of a laser interferometer for measuring a position of a wafer stage and satisfying Abbe's condition with respect to a projection lens and a set (for X and Y direction) of the laser interferometer and satisfying Abbe's condition with respect to off-axis alignment system.
When a fiducial mark on the wafer stage is positioned directly under the projection lens, a presetting is performed so that measuring values by the two sets of laser interferometers are equal to each other.

REFERENCES:
patent: 4269505 (1981-05-01), Mayer
patent: 4414749 (1983-11-01), Johannsmeier
patent: 4452526 (1984-06-01), Johannsmeier et al.
patent: 4677301 (1987-06-01), Tanimoto et al.
patent: 4710026 (1987-12-01), Magome et al.
patent: 4725737 (1988-02-01), Nakat et al.
patent: 4897553 (1990-01-01), Nishi
patent: 5003342 (1991-03-01), Nishi
patent: 5138176 (1992-08-01), Nishi
IBM Technical Disclosure Bulletin, "Aligning Semiconductor Masks," vol. 13, No. 7, Dec. 1970, p. 1816.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Projection exposure apparatus having an off-axis alignment syste does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Projection exposure apparatus having an off-axis alignment syste, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Projection exposure apparatus having an off-axis alignment syste will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-489927

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.