Resist composition, resin for use in the resist composition,...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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C430S311000, C430S326000, C430S905000, C430S906000, C430S907000, C430S910000, C526S242000, C526S245000

Reexamination Certificate

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08053161

ABSTRACT:
A resist composition comprises: (A) a resin capable of increasing its solubility in an alkali developer by action of an acid; (B) a compound capable of generating an acid upon irradiation with actinic ray or radiation; (C) a resin having at least one of a fluorine atom and a silicon atom; and (D) a solvent, wherein the resin (C) has a degree of molecular weight dispersion of 1.3 or less and a weight average molecular weight of 1.0×104or less.

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B.J. Lin; Semiconductor Foundry, Lithography, and Partners; SPIE; 2002; pp. 11-24; vol. 4688; Emerging Lithographic Technologies VI.
J.A. Hoffnagle, et al.; Liquid immersion deep-ultraviolet interferometric lithography; American Vacuum Society; Nov./Dec. 1999.
Extended European Search Report dated Feb. 12, 2008.

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