Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-05-24
2011-12-13
Wilczewski, Mary (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S314000, C257S316000, C257S239000, C257S269000, C438S264000, C438S255000, C438S257000
Reexamination Certificate
active
08076711
ABSTRACT:
According to an aspect of the invention, there is provided a semiconductor device including a plurality of memory cells, comprising a plurality of floating gate electrodes which are formed on a tunnel insulating film formed on a semiconductor substrate and have an upper portion which is narrower in a channel width direction than a lower portion, an interelectrode insulating film formed on the floating gate electrodes, and a control gate electrode which is formed on the interelectrode insulating film formed on the floating gate electrodes and partially buried between the floating gate electrodes opposing each other.
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Aritome, S. et al., “A 0.67μm2Self-Aligned Shallow Trench Isolation Cell (SA-STI Cell) For 3V-only 256 Mbit NAND EPROMs,” ULSI Research Laboratories, Toshiba R&D Center, 1994 IEEE (4 pages).
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Green Telly
Kabushiki Kaisha Toshiba
Wilczewski Mary
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