Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-07-29
2011-11-29
Le, Thao (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE29256, C257SE21417, C438S217000
Reexamination Certificate
active
08067801
ABSTRACT:
A semiconductor device is provided, which comprises a first transistor and a second transistor formed in a semiconductor layer. The first transistor includes a first source region and a first drain region sandwiching a first gate electrode with the first source region. The second transistor includes an LDD region and a drift region sandwiching the second gate electrode with the LDD region, and a second drain region adjacent to the drift region to sandwich the second gate electrode with the second source region. The first gate electrode has a first sidewall formed on sides thereof and the second gate electrode has a second sidewall formed on sides thereof. The width of the former along the first insulator differs from the width of the latter along the second insulator.
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Matsudai Tomoko
Obatake Manji
Yasuhara Norio
Kabushiki Kaisha Toshiba
Le Thao
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Warrior Tanika
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