Temporary etchable liner for forming air gap

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S639000, C438S675000

Reexamination Certificate

active

08030202

ABSTRACT:
An exemplary method lines the sidewalls of a first opening with a sacrificial material and then fills the first opening with a metallic conductor in a manner such that the metallic conductor contacts the substrate. Next, the method selectively removes the sacrificial material, to create at least one “second” opening along the metallic conductor within the first opening. The method selectively removes portions of the first insulator layer through the second opening to leave at least one air gap between the metallic conductor and the first insulator layer in the lower region of the second opening.

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