Method, program product and apparatus for predicting line...

Data processing: structural design – modeling – simulation – and em – Simulating nonelectrical device or system

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

08050898

ABSTRACT:
A method of generating a model for simulating the imaging performance of an optical imaging system. The method includes the steps of defining the optical imaging system and a process to be utilized by the optical imaging system; defining a first model representing the imaging performance of the optical imaging system and the process, and calibrating the model, where the first model generates values corresponding to a latent image slope. The method further includes the step of defining a second model for estimating a line width roughness of a feature to be imaged, where the second model utilizes the latent image slope values to estimate the line width roughness.

REFERENCES:
patent: 5229872 (1993-07-01), Mumula
patent: 5296891 (1994-03-01), Vogt et al.
patent: 5523193 (1996-06-01), Nelson
patent: 5876885 (1999-03-01), Mimotogi et al.
patent: 5969441 (1999-10-01), Loopstra et al.
patent: 6046792 (2000-04-01), Van Der Werf et al.
patent: 7521405 (2009-04-01), Zhang et al.
patent: 7600213 (2009-10-01), Nojima et al.
patent: 2007/0032896 (2007-02-01), Ye et al.
patent: 2008/0004852 (2008-01-01), Satake et al.
patent: 09-043828 (1997-02-01), None
patent: 2002-221787 (2002-08-01), None
patent: 2003-241386 (2003-08-01), None
patent: 2003-302214 (2003-10-01), None
patent: 2005-221801 (2005-08-01), None
patent: 2005-292827 (2005-10-01), None
patent: 2005-302800 (2005-10-01), None
patent: 2006-154245 (2006-06-01), None
patent: 2007-324479 (2007-12-01), None
V. Constantoudis et al., “Line edge roughness and critical dimension variation: Fractal characterization and comparison using model functions”, 2004, Journal of Vaccuum Science and Technology B vol. 22, issue 4, pp. 1974-1981.
Schmid et al. “Spatial distribution of reaction products in positive tone chemically amplified resists”, J. Vac. Sci. Technology, B 20(1), Jan./Feb. 2002, American Vacuum Society, pp. 185-190.
Pawloski et al., “Characterization of line edge roughness in photoresist using an image fading technique”, Advances in Resist Technology and Processing XXI, Proceedings of SPIE vol. 5376, pp. 414-425, 2004.
Michaelson et al., “The Effects of Chemical Gradients and Photoresist Composition on Lithographically Generated Line Edge Roughness”, Advances in Resist Technology and Processing XXII, Proceedings of SPIE, vol. 5753, pp. 368-379, 2005.
Biafore, John J. et al., “Mechanistic Simulation of Line-Edge Roughness”,Proc. Of SPIE, vol. 6519, (2007), pp. 1-17.
Gallatin, Gregg M., “Resist Blur and Line Edge Roughness”,Proc. SPIE, vol. 5754, (2005), pp. 38-52.
Pawloski, Adam R. et al., “Gradients in Chemically Amplified Resist Define Lithographically Generated Line Edge Roughness”, Proc. ARCH Microelectron. Mat. Interface Conf., 41stInterface Symposium Conf., Tempe, AZ (2004), pp. 1-10.
Sanchez, Martha I. et al., “Aerial Image Contrast using Interferometric Lithography: Effect on Line-Edge Roughness”,SPIE, vol. 3678, (Mar. 1999), pp. 160-171.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method, program product and apparatus for predicting line... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method, program product and apparatus for predicting line..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method, program product and apparatus for predicting line... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4275993

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.