Method for fabricating semiconductor device and...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S618000

Reexamination Certificate

active

08034707

ABSTRACT:
A method for fabricating a semiconductor device includes the steps of forming a plurality of lower interconnections at intervals in a first insulating film; removing a portion of the first insulating film located between the lower interconnections, thereby forming an interconnection-to-interconnection gap; forming a second insulating film over the first insulating film in which the lower interconnections and the interconnection-to-interconnection gap are formed such that an air gap is formed out of the interconnection-to-interconnection gap; and forming, in the second insulating film, a connection portion connected to one of the lower interconnections and an upper interconnection connected to the connection portion. The connection portion is formed to be connected to one of the lower interconnections not adjacent to the air gap.

REFERENCES:
patent: 5861674 (1999-01-01), Ishikawa
patent: 6054381 (2000-04-01), Okada
patent: 6239016 (2001-05-01), Ishikawa
patent: 6451669 (2002-09-01), Torres et al.
patent: 6509623 (2003-01-01), Zhao
patent: 6524948 (2003-02-01), Tamaoka et al.
patent: 6545361 (2003-04-01), Ueda et al.
patent: 6887766 (2005-05-01), Koh
patent: 7041571 (2006-05-01), Strane
patent: 7449407 (2008-11-01), Lur et al.
patent: 2003/0183940 (2003-10-01), Noguchi et al.
patent: 2009/0280642 (2009-11-01), Shimooka et al.
patent: 2009/0302473 (2009-12-01), Shibata et al.
patent: 09-027546 (1997-01-01), None
patent: 09-055431 (1997-02-01), None
patent: 10-233448 (1998-09-01), None
patent: 2000-091426 (2000-03-01), None
patent: 2001-053144 (2001-02-01), None
patent: 2001-284355 (2001-10-01), None
patent: 2003-068851 (2003-03-01), None
Arnal et al.; “A Novel SiO2-Air Gap Low K for Copper Dual Damascene Interconnect”; Advanced Metallization; c. 2000; pp. 71-76.
Japanese Office Action, with English Translation, issued in corresponding Japanese Patent Application No. JP 2004-309579, mailed on Dec. 18, 2007.
Notice of Allowance issued in U.S. Appl. No. 12/786,156, dated Jul. 2, 2010.
Japanese Notice of Reasons for Rejection, with English Translation, issued in Japanese Patent Application No. 2008-032950, mailed Feb. 1, 2011.

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