Internal voltage level shifting for screening cold or hot...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

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08030954

ABSTRACT:
Operation of an internal voltage supply level (Vgg) of an IC is characterized over operating temperature or at a selected temperature to determine a temperature-equivalent internal voltage level. The internal voltage supply of the IC is set to the temperature-equivalent level, and the IC is tested at room temperature to screen for low-temperature defects or high-temperature defects.

REFERENCES:
patent: 5465063 (1995-11-01), Fukuda et al.
patent: 7307468 (2007-12-01), Vasudevan
patent: 7400123 (2008-07-01), Voogel
Malinoski et al.,Rapid-Response Temperature Control Provides New Defect Screening Opportunities, IEEE, ITC Int'l Test Conf., paper 32.1, pp. 903-907 (2001).
Nigh et al.,Test Method Evaluation Experiments&Data, IEEE, Proceedings of the 2000 IEEE International Test Conference, pp. 454-463 (2000).
Schuermyer et al.,Minimum Testing Requirements to Screen Temperature Dependent Defects, IEEE, ITC Int'l Test Conf., paper 11.2, pp. 300-308 (2004).
Tarun et al.,Room Temperature Defect Localization of Hot and Cold Failures using Scanning Probe Microscopy Techniques, IEEE, Physical and Failure Analysis of Integrated Circuits, 2005, Proceedings of the 12thInt'l Symposium, IPFA, pp. 5-8 (2005).

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