Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2009-06-17
2011-10-18
Thai, Luan C (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C227S059000, C227S059000, C227S059000, C227S059000
Reexamination Certificate
active
08039883
ABSTRACT:
In a solid-state image pick up device, a first conduction type semiconductor layer which has a first surface side. A second surface side which is located the opposite side of the first surface side and an image sensor area. A photo-conversion area which is configured in the first surface side and charges electron by photoelectric conversion. A first diffusion area of second conduction type for isolation, wherein the first diffusion area surrounds the photo-conversion area and extends from the first surface side to the middle part of the semiconductor layer and a second diffusion area of second conduction type for isolation, wherein the second diffusion area extends from the second surface side to the bottom of the first diffusion layer.
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Yasushi Maruyama, et al. “A back-illuminated high-sensitivity small-pixel color CMOS image sensor with flexible layout of metal wiring”, ITE Technical Report vol. 30, No. 25, IST2006-14, CE2006-43(Mar. 2006) 4 pages (with English Abstract).
Kabushiki Kaisha Toshiba
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Thai Luan C
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