Probe device having first and second probe pins

Details Probe device having first and second probe pins Probe device having first and second probe pins

2009-09-11

2011-12-27

Phan, Huy Q (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755070, C324S756040

Reexamination Certificate

active

08085057

ABSTRACT:
A probe device includes a probe body having a plurality of first holes extending through a first face thereof and a plurality of second holes aligned with the first holes and extending through an opposite second face thereof, a plurality of spaced-apart first probe pins inserted fittingly and removably into respective first holes and each including a first contact portion extending out of the first face, and a first connecting portion extending into the respective first hole, and a plurality of spaced-apart second probe pins inserted fittingly and removably into respective second holes and each including a second contact portion extending out of the second face, and a second connecting portion extending into the respective second hole and having an insert space. The first connecting portion is inserted fittingly and removably into the insert space, and mates with the second connecting portion.

REFERENCES:
patent: 5410260 (1995-04-01), Kazama
patent: 6992496 (2006-01-01), Winter et al.
patent: 7372286 (2008-05-01), Lee et al.

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