Semiconductor device having polysilicon thin-film

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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H01L 29792

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active

058775269

ABSTRACT:
In the crystal structure of a polysilicon thin film having a field effect mobility .mu..sub.FE of about 80 cm.sup.2 /V.sec, a grain size is about 200 nm and a crystallite size on the (111) plane is about 180 nm. The crystal size corresponds to the size of a completely monocrystallized portion of a grain. The condition of obtaining a field effect mobility .mu..sub.FE of about 80 cm.sup.2 /V.sec is that the crystallite size on the (111) plane is at least 180 nm (measured value). By taking the crystallite size into consideration, it becomes possible to achieve a high field effect mobility .mu..sub.FE which cannot be obtained merely by increasing the grain size.

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