Fuse monitoring circuit for semiconductor memory device

Details Fuse monitoring circuit for semiconductor memory device Fuse monitoring circuit for semiconductor memory device

2008-06-30

2010-11-02

Elms, Richard (Department: 2824)

Static information storage and retrieval

Read/write circuit

Having fuse element

C365S189060, C365S189080

Reexamination Certificate

active

07826296

ABSTRACT:
A fuse monitoring circuit for a semiconductor device includes a repair fuse unit including a number of fuses to which a repair address is programmed, and configured to output fuse state signals corresponding to the connection states of the respective fuses in response to a fuse initialization signal. A serial fuse monitoring unit is configured to output a fuse state monitoring signal corresponding to each fuse state signal selected by an applied address in response to a serial monitoring test mode signal. Also, a parallel fuse monitoring unit is configured to output a repair monitoring signal by comparing an applied address and the repair address in response to a parallel monitoring test mode signal. An output unit is configured to output the fuse state monitoring signal and the repair monitoring signal to an output pad in response to an output control signal.

REFERENCES:
patent: 7158435 (2007-01-01), Kobayashi et al.
patent: 2009/0168581 (2009-07-01), Im et al.
patent: 91-001533 (1991-03-01), None
patent: 1020020040116 (2002-05-01), None
patent: 1020050102305 (2005-10-01), None
patent: 1020090070862 (2009-07-01), None
Notice of Allowance issued from Korean Intellectual Property Office on Sep. 1, 2009 with an English Translation.
Notice of Prelimary Rejection issued from Korean Intellectual Property Office on Apr. 24, 2009 with an English Translation.

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