Test-device system for independent characterization of...

Details Test-device system for independent characterization of... Test-device system for independent characterization of...

2007-12-31

2010-12-14

Patidar, Jay M (Department: 2858)

Electricity: measuring and testing

Magnetic

Magnetic information storage element testing

Reexamination Certificate

active

07852072

ABSTRACT:
A test-device system and method for deconvoluting measurements of effects of a sensor-width definition process from measurements of effects of a sensor-stripe-height-definition process in a manufacture of a magnetic sensor. The test-device system comprises a first test device for generating data to characterize a sensor-width-definition process. The test-device system also comprises a second test device for generating data to characterize a sensor-stripe-height-definition process. The test-device system allows independent characterization of a sensor-width parameter and a sensor-stripe-height parameter.

REFERENCES:
patent: 6642713 (2003-11-01), Diederich
patent: 6731110 (2004-05-01), Church
patent: 2004/0257715 (2004-12-01), Heim et al.
patent: 2009/0166331 (2009-07-01), Marley

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