Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With decomposition of a precursor
Reexamination Certificate
2005-07-20
2010-11-02
Rao, G. Nagesh (Department: 1792)
Single-crystal, oriented-crystal, and epitaxy growth processes;
Forming from vapor or gaseous state
With decomposition of a precursor
C117S003000, C117S043000, C117S089000, C117S101000, C117S106000
Reexamination Certificate
active
07824493
ABSTRACT:
A method for manufacturing a silicon wafer includes a step of annealing a silicon wafer which is sliced from a silicon single crystal ingot, thereby forming a DZ layer in a first surface and in a second surface of the silicon wafer and a step of removing either a portion of the DZ layer in the first surface or a portion of the DZ layer in the second surface.
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Japanese Office Action dated Apr. 26, 2010 for Appl. No. 2004-214983.
Hourai Masataka
Ono Toshiaki
Sugimura Wataru
Pillsbury Winthrop Shaw & Pittman LLP
Rao G. Nagesh
Sumitomo Mitsubishi Silicon Corporation
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