Process for improved contact stud structure for semiconductor de

Fishing – trapping – and vermin destroying

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437190, 437195, 437189, 357 71, H01L 2190, H01L 2144

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active

050082167

ABSTRACT:
A method for forming contact studs to connect the substrate component devices to the overlying wiring patterns is disclosed herein. The contact studs are formed by a combination of blanket depositing an adhesive and reactive layer into the contact opening. Onto said adhesive and reactive layer is deposited a seed layer and said contact stud is completed by filling the contact opening with a third metal layer. Preferably, the adhesive and reactive layer is a transistion metal and the seed and filler layers are refractory metals.

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patent: 4800176 (1989-01-01), Kakumu et al.
patent: 4822753 (1989-04-01), Pintchovski
patent: 4884123 (1989-11-01), Dixit et al.
"Contact Resistance Improvement for Tungsten Metallurgy", IBM Tech. Disc. Bulletin, vol. 32, No. 8B, Jan. 1990, p. 50.
Y. Pauleau, "Interconnect Materials for VLSI Circuits," Solid State Technology, vol. 30, No. 4, pp. 155-162 (Apr. 1987).

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