Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2008-07-09
2010-11-30
Nguyen, VanThu (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S225700
Reexamination Certificate
active
07843748
ABSTRACT:
A test apparatus includes a test fuse unit for generating a test fuse signal in response to a test mode signal during a test time and generating a test fuse signals according to a fuse cutting after a termination of the test time, a combination signal generating unit for storing a test signal and inactivating a combination signal when the test mode signal is inactivate and for outputting the stored test signal as the combination signal when the test mode signal is activate, and a code signal generating unit for activating a test code signal when one of the test fuse signal and the combination signal is activated.
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Cho Kwang-Jun
Kim Jong-Sam
Baker & McKenzie LLP
Hynix / Semiconductor Inc.
Nguyen Van-Thu
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