Semiconductor structure including doped silicon carbon liner...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S288000, C257S374000, C438S303000

Reexamination Certificate

active

07667263

ABSTRACT:
A semiconductor structure and related method for fabrication thereof includes a liner layer interposed between: (1) a pedestal shaped channel region within a semiconductor substrate; and (2) a source region and a drain region within a semiconductor material layer located upon the liner layer and further laterally separated from the pedestal shaped channel region within the semiconductor substrate. The liner layer comprises an active doped silicon carbon material. The semiconductor material layer may comprises a semiconductor material other than a silicon carbon semiconductor material. The semiconductor material layer may alternatively comprise a silicon carbon semiconductor material having an opposite dopant polarity and lower carbon content in comparison with the liner layer. Due to presence of the silicon carbon material, the liner layer inhibits dopant diffusion therefrom into the pedestal shaped channel region. Electrical performance of a field effect device that uses the pedestal shaped channel region is thus enhanced.

REFERENCES:
patent: 6153920 (2000-11-01), Gossmann et al.
patent: 6818938 (2004-11-01), Naem
patent: 7064399 (2006-06-01), Babcock et al.
patent: 2004/0161875 (2004-08-01), Chu et al.
patent: 2004/0207013 (2004-10-01), Tsuchiya et al.
patent: 2004/0262694 (2004-12-01), Chidambaram
patent: 2005/0023520 (2005-02-01), Lee et al.
patent: 2008/0083949 (2008-04-01), Zhu et al.
Satoshi Nishikawa et al., “Reduction of transient boron diffusion in preamorphized Si by carbon implantation”, Appl. Phys. Lett., 60 (18), May 4, 1992, pp. 2270-72.
Ibrahim Ban et al., “Suppression of Oxidation-Enhanced Boron Diffusion in Silicon by Carbon Implantation and Characterization of MOSFET's with Carbon-Implanted Channels”, IEEE Transactions on Electron Devices, vol. 44, No. 9, Sep. 1997, pp. 1544-1551.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor structure including doped silicon carbon liner... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor structure including doped silicon carbon liner..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor structure including doped silicon carbon liner... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4206047

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.