Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-02-13
2010-02-16
Levin, Naum B (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07665057
ABSTRACT:
A method for calculating optimal length of trace between adjoining bends is disclosed. First, a rising time Tr of signal of a trace is defined, and a unit transmitting delay TDof the trace and a transmitting delay Td3of bend in the trace are calculated. A transmitting delay Td2of a trace segment between the adjoining bends in the trace is calculated with Tr and Td3. Finally, an equation L2=Td2/TDis calculated for obtaining the optimal length L2of the trace between a first bend and a second bend.
REFERENCES:
patent: 3765773 (1973-10-01), Weiner
patent: 5610833 (1997-03-01), Chang et al.
patent: 6521467 (2003-02-01), Laureanti
patent: 6834380 (2004-12-01), Khazei
patent: 7054795 (2006-05-01), Aves
patent: 7251791 (2007-07-01), Wang
patent: 7397320 (2008-07-01), Bokhari
patent: 7454300 (2008-11-01), Suaya et al.
patent: 2003/0088394 (2003-05-01), Min et al.
patent: 2004/0227580 (2004-11-01), Otsuka et al.
patent: 2007/0064923 (2007-03-01), Schmukler et al.
patent: 2007/0136706 (2007-06-01), Hwang et al.
patent: 2007/0171733 (2007-07-01), Wood
patent: 2009/0204934 (2009-08-01), Lin
Inventec C'orporation
J.C. Patents
Levin Naum B
LandOfFree
Method for calculating optimal length of trace between... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for calculating optimal length of trace between..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for calculating optimal length of trace between... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4187649