Method for calculating optimal length of trace between...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000, C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

07665057

ABSTRACT:
A method for calculating optimal length of trace between adjoining bends is disclosed. First, a rising time Tr of signal of a trace is defined, and a unit transmitting delay TDof the trace and a transmitting delay Td3of bend in the trace are calculated. A transmitting delay Td2of a trace segment between the adjoining bends in the trace is calculated with Tr and Td3. Finally, an equation L2=Td2/TDis calculated for obtaining the optimal length L2of the trace between a first bend and a second bend.

REFERENCES:
patent: 3765773 (1973-10-01), Weiner
patent: 5610833 (1997-03-01), Chang et al.
patent: 6521467 (2003-02-01), Laureanti
patent: 6834380 (2004-12-01), Khazei
patent: 7054795 (2006-05-01), Aves
patent: 7251791 (2007-07-01), Wang
patent: 7397320 (2008-07-01), Bokhari
patent: 7454300 (2008-11-01), Suaya et al.
patent: 2003/0088394 (2003-05-01), Min et al.
patent: 2004/0227580 (2004-11-01), Otsuka et al.
patent: 2007/0064923 (2007-03-01), Schmukler et al.
patent: 2007/0136706 (2007-06-01), Hwang et al.
patent: 2007/0171733 (2007-07-01), Wood
patent: 2009/0204934 (2009-08-01), Lin

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