Semiconductor device, method for manufacturing semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C438S183000, C438S926000

Reexamination Certificate

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07812406

ABSTRACT:
A method for manufacturing a semiconductor device has forming a first insulating film on a semiconductor substrate, forming an electrode layer on said first insulating film, etching said electrode layer, said first insulating film and said semiconductor substrate of a first predetermined region to form a trench, burying an element-isolating insulating film in said trench, forming a second insulating film on said element-isolating insulating film and above said electrode layer, etching said second insulating film, said electrode layer and said element-isolating insulating film of a second predetermined region to form a gate pattern and a dummy pattern, forming a third insulating film for covering said gate pattern and said dummy pattern, and planarizing said third insulating film using said second insulating film as a stopper.

REFERENCES:
patent: 6555427 (2003-04-01), Shimizu et al.
patent: 6661052 (2003-12-01), Matsui et al.
patent: 2003-243617 (2003-08-01), None
patent: 2004-349622 (2004-12-01), None

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