Group-III nitride based laser diode and method for...

Coherent light generators – Particular active media – Semiconductor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C372S045012, C372S043010

Reexamination Certificate

active

07813400

ABSTRACT:
A laser diode comprising a first separate confinement heterostructure and an active region on the first separate confinement heterostructure. A second separate confinement heterostructure is on the active region and one or more epitaxial layers is on the second separate confinement heterostructure. A ridge is formed in the epitaxial layers with a first mesa around the ridge. The first mesa is 0.1 to 0.2 microns above the second confinement heterostructure.

REFERENCES:
patent: 4152044 (1979-05-01), Liu
patent: 4675575 (1987-06-01), Smith
patent: 5477436 (1995-12-01), Bertling et al.
patent: 5592501 (1997-01-01), Edmond et al.
patent: 5838706 (1998-11-01), Edmond et al.
patent: 6046464 (2000-04-01), Schetzina
patent: 6330111 (2001-12-01), Myers
patent: 6331915 (2001-12-01), Myers
patent: 6657393 (2003-12-01), Natsume
patent: 6746889 (2004-06-01), Eliashevich et al.
patent: 6784463 (2004-08-01), Camras et al.
patent: 6932497 (2005-08-01), Huang
patent: 7087936 (2006-08-01), Negley
patent: 2002/0015013 (2002-02-01), Ragle
patent: 2002/0054495 (2002-05-01), Natsume
patent: 2003/0015708 (2003-01-01), Parikh et al.
patent: 2003/0020069 (2003-01-01), Holmes et al.
patent: 2003/0165169 (2003-09-01), Nomoto et al.
patent: 2004/0207313 (2004-10-01), Omoto et al.
patent: 2005/0173692 (2005-08-01), Park et al.
patent: 2006/0034576 (2006-02-01), Merritt et al.
patent: 2006/0081862 (2006-04-01), Chua et al.
patent: 2006/0158899 (2006-07-01), Ayabe et al.
patent: 2007/0025231 (2007-02-01), Ochiai et al.
patent: 2007/0090383 (2007-04-01), Ota et al.
patent: 2008/0036364 (2008-02-01), Li et al.
patent: 0936682 (1999-08-01), None
patent: 0936682 (1999-08-01), None
patent: 1349202 (2003-10-01), None
patent: 1653255 (2006-05-01), None
patent: 1681509 (2006-07-01), None
patent: 2586844 (1987-03-01), None
patent: 2759188 (1998-08-01), None
patent: 2814220 (2002-03-01), None
patent: 9856043 (1998-12-01), None
patent: WO 9856043 (1998-12-01), None
patent: WO 0211212 (2002-02-01), None
patent: 03044870 (2003-05-01), None
patent: WO 03/080763 (2003-10-01), None
patent: WO 2007005844 (2007-01-01), None
The Second Office Action from People's Republic of China, re: China Application No. 200480027969.2, date: Jul. 4, 2008.
International Search Report for PCT/US2008/004453, Date: Sep. 9, 2008.
Written Opinion for PCT/US2008/004453, Date: Sep. 9, 2008.
Publication No. 2005/152127, Publication Date: Jul. 14, 2005.
Publication No. 2005/077535, Publication Date: Apr. 14, 2005.
Publication No. 2006/220046, Publication Date: Oct. 5, 2006.
Publication No. 2008/074032 Publication Date: Mar. 27, 2008.
Kim J K et al. “Strongly Enhanced Phosphor Efficiency in GaInN White Light-Emitting Diodes Using Remote Phosphor Configuration and Diffuse Reflector Cup”, Japanese Journal of Applied Physics, Japan Society of Applied Physics, Tokyo, JP, vol. 44, No. 20-23, Jan. 1, 2005, XP-001236966.
Notice Requesting Submission of Opinion re related Korean Application No. 10-2004-7001033, dated: Mar. 9, 2009.
Sakai et al., “Experimental Investigation of Dependence of Electrical Characteristics on Device Parameters in Trench Mos Barrier Shottky Diodes”, Proceedings of 1998 International Symposium on Power Semiconductor Devices & ICs, Kyoto, pp. 293-296, Jun. 1998.
Zhang AP et al, “Comparison of Gan P-I-N and Schottky Rectifier Performance” IEEE Transactions on Electron Devices, IEEE Inc. New York, US, vol. 48, No. 3, pp. 407-411, Mar. 2001.
European Search Report, Feb. 24, 2009, re related European Application No. EP 08253301.
Zhang et al. “Comparison of GaN P-I-N and Schottky Rectifier Performance”, IEEE Transactions on Electron Devices, vol. 48, No. 3, Mar. 2001, pp. 407-411.
Sakai et al., “Experimental Investigation of Dependence of Electrical Characteristics on Device Parameters in Trench MOS Barrier Schottky Diodes”, 1998, International Symposium on Power Semiconductor Devices & ICs, Kyoto, pp. 293-296.
European Search Report re related European Application No. 08253301.9-2222, Feb. 24, 2009.
European Search Report re related EP Appl. 08160129.6.2222, Dated: Dec. 15, 2008.
Asbeck et al.“Enhancement of Base Conductivity Via the Piezoelectric Effect in AlGaN/GaN HBTs”, Solid State Electronics, Elsevier Science Pub. Barking GB, vol. 44, No. 2, Feb. 1, 2000 pp. 211-219, XP004186190.
Simon et al. “Polarization-Induced 3-Dimensional Electron Slabs in Graded A1GaN Layers”, Materials Research Society Symposium Proceedings 2006 Materials Research Society US, vol. 892, Nov. 28, 2005, pp. 417-722.
Offical Notice of Final Decision of Rejection re related Japanesse Patent Appl. No. 2003-529535, Dated: Jan. 6, 2009.
European Communication from related European Appl. 02 798 906.0-1235, Dated Feb. 6, 2009.
Copending U.S. Appl. No. 11/443,741, date: Jun. 14, 2007.
Copending U.S. Appl. No. 11/685,761, date: Mar. 13, 2007.
Copending U.S. Appl. No. 11/939,059, date: Nov. 13, 2007.
PCT Search Report and Written Opinion PCT/US2007/086237, date: May 8, 2008 in related application.
PCT Search Report and Written Opinion PCT/US2007/12403, Date: Aug. 6, 2008.
PCT Search Report and Written Opinion PCT/US2007/086242, Date: Mar. 4, 2008.
U.S. Appl. No. 11/613,692, filed Dec. 20, 2006.
U.S. Appl. No. 11/614,180, filed Dec. 21, 2006.
U.S. Appl. No. 11/624,811, filed Jan. 19, 2007.
U.S. Appl. No. 11/743,754, filed May 3, 2007.
U.S. Appl. No. 11/751,982, filed May 22, 2007.
U.S. Appl. No. 11/753,103, filed May 24, 2007.
U.S. Appl. No. 11/751,990, filed May 22, 2007.
U.S. Appl. No. 11/755,153, filed May 30, 2007.
U.S. Appl. No. 11/856,421, filed Sep. 17, 2007.
U.S. Appl. No. 11/859,048, filed Sep. 21, 2007.
U.S. Appl. No. 11/939,047, filed Nov. 13, 2007.
U.S. Appl. No. 11/936,163, filed Nov. 7, 2007.
U.S. Appl. No. 11/843,243, filed Aug. 22, 2007.
U.S. Appl. No. 11/939,052, filed Nov. 13, 2007.
U.S. Appl. No. 11/736,799, filed Apr. 18, 2007.
U.S. Appl. No. 11/877,038, filed Oct. 23, 2007.
U.S. Appl. No. 11/870,679, filed Oct. 11, 2007.
U.S. Appl. No. 11/948,041, filed Nov. 30, 2007.
U.S. Appl. No. 11/949,222, filed Dec. 3, 2007.
U.S. Appl. No. 12/174,053, filed Jul. 16, 2008.
U.S. Appl. No. 12/002,429, filed Dec. 4, 2007.
U.S. Appl. No. 12/045,729, filed Mar. 11, 2008.
U.S. Appl. No. 11/818,818, filed Jun. 14, 2007.
Notice of First Office Action from related China Patent Application No. 200710142217.6, dated: Jun. 22, 2009.
Office Action from related U.S. Appl. No. 11/600,618, dated: Feb. 4, 2010.
European Search Report from related European Application No. 07254498.4, received on Feb. 11, 2010.
(From related application) Canadian Patent Application No. 2,454,310, Office Action dated Feb. 9, 2010.
Official Communication from the EPO regarding related European Application 08253301.9, dated: Nov. 17, 2009.
Second Office Action from related Chinese Application No. 200710142217.6, dated: Nov. 6, 2009.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Group-III nitride based laser diode and method for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Group-III nitride based laser diode and method for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Group-III nitride based laser diode and method for... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4182833

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.