Method and system for testing an integrated circuit

Details Method and system for testing an integrated circuit Method and system for testing an integrated circuit

2008-01-30

2010-06-01

Tran, Michael T (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S195000

Reexamination Certificate

active

07729186

ABSTRACT:
An integrated circuit comprising:a) at least one integrated voltage generator for generating a low voltage for an associated integrated load;b) an integrated voltage generator test logic connected to the voltage generator which in a test operating mode which is the operating state of that integrated voltage generator between an active operating state and a standby operating state depending on an external control signal;c) an internal load switch for switching said generated load voltage to that integrated load said internal load switch being controllable by means of an internal control signal;d) wherein said voltage generator test logic in said test operating mode switches the operating state of said integrated voltage generator independently of the associated internal control switching signal for setting a temporal voltage profile of said load voltage applied to that load.

REFERENCES:
patent: 2005/0082566 (2005-04-01), Menard et al.
patent: 102004010704 (2005-10-01), None
patent: 102004022326 (2005-12-01), None
patent: 102005035444 (2006-03-01), None

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