Integrated circuit

Electronic digital logic circuitry – Multifunctional or programmable – Sequential or with flip-flop

Reexamination Certificate

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Details

C326S093000, C327S294000

Reexamination Certificate

active

07808272

ABSTRACT:
An integrated circuit for analyzing the waveform of an input signal includes a first storage circuit and a second storage circuit that are each supplied with the input signal. The first and second storage circuits are controlled by a clock signal. The first storage circuit is used to store a state for the input signal when the clock signal has a rising edge. The second storage circuit is used to store a state for the input signal when the clock signal has a falling edge. An evaluation circuit compares the states of the input signal that are stored in the first and second storage circuits during a selected time span. The comparison can be used to decide whether the input signal assumes periodic fluctuations or an approximately permanently static value during the time span.

REFERENCES:
patent: 6507230 (2003-01-01), Milton
patent: 2003/0043935 (2003-03-01), Noh
patent: 0074 847 (1983-03-01), None
patent: 0 748 047 (1996-12-01), None

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