Semiconductor device and system

Details Semiconductor device and system Semiconductor device and system

2008-10-21

2010-10-05

Ho, Hoai V (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S189150, C365S189160, C365S189170, C365S189070

Reexamination Certificate

active

07808850

ABSTRACT:
First and second data output circuits obtain corresponding parts of read data of a storage circuit to output to first and second input/output pads in a second test mode. First and second data input circuits obtain output data of the first and second data output circuits via the first and second input/output pads to output in the second test mode. A comparison object selection circuit selects output data of the first and second data input circuits to output in the second test mode. A judging circuit performs a test judgment by comparing output data of the comparison object selection circuit with expected value data and outputs a test result signal in the second test mode.

REFERENCES:
patent: 6823485 (2004-11-01), Muranaka
patent: 7230861 (2007-06-01), Inoue
patent: 2003/0210069 (2003-11-01), Kikuchi et al.
patent: 2007/0208526 (2007-09-01), Staudt et al.
patent: 3-3200 (1991-01-01), None
patent: 2002-082714 (2002-03-01), None
patent: 2002-358798 (2002-12-01), None
patent: 2004-021833 (2004-01-01), None
patent: 2004-251730 (2004-09-01), None

Affiliated with

Also associated with

Rating

Semiconductor device and system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and system will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4169016