Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-09-25
2010-02-09
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07661079
ABSTRACT:
A method of designing a semiconductor integrated circuit includes defining a tolerable range in which an operating temperature and an operating power supply voltage of a semiconductor integrated circuit are allowed to vary, computing a target temperature and a target power supply voltage that cancel variation in circuit characteristics caused by process variation of the semiconductor integrated circuit, separately for each circuit characteristic responsive to the process variation, and designing the semiconductor integrated circuit such that the semiconductor integrated circuit properly operates with any temperature and power supply voltage within the tolerable range based on an assumption that the semiconductor integrated circuit is to operate within the tolerable range centered substantially at the target temperature and target power supply voltage.
REFERENCES:
patent: 7475366 (2009-01-01), Kuemerle et al.
patent: 2004/0216067 (2004-10-01), Tanaka et al.
patent: 2008/0034337 (2008-02-01), Kuemerle et al.
patent: 2002-324097 (2002-11-01), None
patent: 2002-353083 (2002-12-01), None
Chiang Jack
Fujitsu Microelectronics Limited
Fujitsu Patent Center
Tat Binh C
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