Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2008-07-23
2010-06-15
Garber, Charles D (Department: 2812)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C257SE21584
Reexamination Certificate
active
07737037
ABSTRACT:
An object of the invention is to provide a semiconductor device which includes a barrier metal having high adhesiveness and diffusion barrier properties and a method of manufacturing the semiconductor device. The invention provides a semiconductor device manufacturing method including forming a first layer made of a material containing silicon on a base substance; forming a second layer containing metal and nitrogen on the first layer; and exposing the second layer to active species obtained from plasma in an atmosphere including reducing gas.
REFERENCES:
patent: 4847111 (1989-07-01), Chow et al.
patent: 6528419 (2003-03-01), Kordic et al.
patent: 6534405 (2003-03-01), Wu
patent: 6586330 (2003-07-01), Ludviksson et al.
patent: 2003/0190813 (2003-10-01), Huang et al.
patent: 2005/0009325 (2005-01-01), Chung et al.
patent: 2001-298028 (2001-10-01), None
patent: 2002-319618 (2002-10-01), None
patent: 2003-017493 (2003-01-01), None
patent: 2004-343443 (2004-11-01), None
Japanese Patent Office issued a Japanese Office Action dated Sep. 15, 2009, Application No. 2004-343443.
Furuya Akira
Ogawa Shin-ichi
Okamura Hiroshi
Otsuka Nobuyuki
Garber Charles D
Isaac Stanetta D
NEC Electronics Corporation
Young & Thompson
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