Semiconductor device and method of manufacturing the same

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE21584

Reexamination Certificate

active

07737037

ABSTRACT:
An object of the invention is to provide a semiconductor device which includes a barrier metal having high adhesiveness and diffusion barrier properties and a method of manufacturing the semiconductor device. The invention provides a semiconductor device manufacturing method including forming a first layer made of a material containing silicon on a base substance; forming a second layer containing metal and nitrogen on the first layer; and exposing the second layer to active species obtained from plasma in an atmosphere including reducing gas.

REFERENCES:
patent: 4847111 (1989-07-01), Chow et al.
patent: 6528419 (2003-03-01), Kordic et al.
patent: 6534405 (2003-03-01), Wu
patent: 6586330 (2003-07-01), Ludviksson et al.
patent: 2003/0190813 (2003-10-01), Huang et al.
patent: 2005/0009325 (2005-01-01), Chung et al.
patent: 2001-298028 (2001-10-01), None
patent: 2002-319618 (2002-10-01), None
patent: 2003-017493 (2003-01-01), None
patent: 2004-343443 (2004-11-01), None
Japanese Patent Office issued a Japanese Office Action dated Sep. 15, 2009, Application No. 2004-343443.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and method of manufacturing the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and method of manufacturing the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and method of manufacturing the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4163802

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.