System and method for identifying original design intents...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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Details

C703S001000, C700S098000, C345S420000

Reexamination Certificate

active

07814441

ABSTRACT:
Programmatic extraction and management of solid and surface modeling parameters from raw 3D scan data is discussed. An automated process reads raw 3D scan data and works in communication with a CAD system able to perform CAD part modeling. The user is provided with an automatic function to segment a mesh model (formed from the raw 3D scan data) into dozens of mesh regions. A graphical user interface is provided which enables a user to choose a type of the design intent along with the mesh regions from which the design intent is calculated. Each design intent is represented in a vector, a plane or a poly-line depending upon the type of design intent. In response to a user demand for the parameters of a modeling feature, a best approximation of the requested parameter value is calculated by processing the raw 3D scan data using a set of functions.

REFERENCES:
patent: 6064759 (2000-05-01), Buckley et al.
patent: 6129872 (2000-10-01), Jang
patent: 6256038 (2001-07-01), Krishnamurthy
patent: 6788210 (2004-09-01), Huang et al.
patent: 2003/0052893 (2003-03-01), Sawada
patent: 2005/0134586 (2005-06-01), Koo et al.

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