Semiconductor device and method for manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257SE27084, C257SE21646, C257S906000

Reexamination Certificate

active

07663174

ABSTRACT:
A first DRAM section including a first memory cell having a first capacitance and a second DRAM section including a second memory cell having a second capacitance different from the first capacitance are provided on the same semiconductor substrate.

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Japanese Office Action issued in corresponding Japanese Patent Application No. JP 2003-023542, dated Nov. 14, 2006.

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