Semiconductor memory device having I/O unit

Details Semiconductor memory device having I/O unit Semiconductor memory device having I/O unit

2007-12-28

2010-11-23

Phung, Anh (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S189050

Reexamination Certificate

active

07839709

ABSTRACT:
A semiconductor memory device is capable of reducing a test time upon the same condition of the actual operation thereof. The semiconductor memory device includes an output data select unit and a data output unit. The output data select unit selectively outputs valid data, which are loaded on a plurality of global lines, in response to an output control signal activated after a delay time corresponding to an additive latency from entry of a read operation in a test mode. The data output unit aligns data outputted from the output data select unit and outputs the aligned data through data pads.

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