Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2004-11-18
2009-10-06
Walke, Amanda C. (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C430S281100, C430S286100, C430S287100, C430S905000, C430S913000
Reexamination Certificate
active
07598014
ABSTRACT:
A negative thick film photoresist composition with improved alkali developability is provided. The composition comprises: (A) a resin component containing (a) from 61 to 90% by weight of a structural unit derived from a cyclic alkyl (meth)acrylate ester, and (b) a structural unit derived from a radical polymerizable compound containing a hydroxyl group, (B) a polymerizable compound containing at least one ethylenic unsaturated double bond, (C) a photopolymerization initiator, and (D) an organic solvent.
REFERENCES:
patent: 5068263 (1991-11-01), Noguchi
patent: 5965328 (1999-10-01), Sano et al.
patent: 6306555 (2001-10-01), Schulz et al.
patent: 6485885 (2002-11-01), Oka et al.
patent: 6702437 (2004-03-01), Fujimaki et al.
patent: 7247659 (2007-07-01), Kura et al.
patent: 2003/0059706 (2003-03-01), Misumi et al.
patent: 762208 (1997-03-01), None
patent: H02-097516 (1990-04-01), None
patent: H08-029979 (1996-02-01), None
patent: 08-078318 (1996-03-01), None
patent: 2000-039709 (2000-02-01), None
Office Action issued on counterpart Japanese Patent Application No. 2004-265693, dated May 7, 2009.
Saito Koji
Washio Yasushi
Knobbe Martens Olson & Bear LLP
Tokyo Ohka Kogyo Co. Ltd.
Walke Amanda C.
LandOfFree
Thick film photoresist composition and method of forming... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Thick film photoresist composition and method of forming..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thick film photoresist composition and method of forming... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4141755