Memory with test mode output

Details Memory with test mode output Memory with test mode output

Filed on

2006-07-24

Date issued

2009-10-27

Examiner

Ellis, Kevin L (Department: 2117)

Patent Class

Error detection/correction and fault detection/recovery

SubClass

Pulse or data error handling

SubSubClass

Memory testing

Other Related Categories

C714S042000

Type

Reexamination Certificate

Status

active

Patent number

07610524

Description

ABSTRACT:
Methods of operating an apparatus allow a memory to generate a test mode signal to trigger a test, in response to the memory detecting a predetermined command from a system bus.

REFERENCES:
patent: 4724378 (1988-02-01), Murray et al.
patent: 5446691 (1995-08-01), North et al.
patent: 5619461 (1997-04-01), Roohparvar
patent: 5745415 (1998-04-01), Marr
patent: 5821760 (1998-10-01), Koeman et al.
patent: 6021459 (2000-02-01), Norman et al.
patent: 6040719 (2000-03-01), Earl
patent: 6141273 (2000-10-01), Ku et al.
patent: 6219292 (2001-04-01), Jang
patent: 6373744 (2002-04-01), Mano
patent: 6445624 (2002-09-01), Janzen et al.
patent: 6467032 (2002-10-01), Lippert
patent: 6538951 (2003-03-01), Janzen et al.
patent: 6628999 (2003-09-01), Klaas et al.
patent: 6647470 (2003-11-01), Janzen
patent: 6658523 (2003-12-01), Janzen et al.
patent: 6678205 (2004-01-01), Johnson et al.
patent: 6724666 (2004-04-01), Janzen et al.
patent: 6775759 (2004-08-01), Janzen
patent: 6779074 (2004-08-01), Janzen
patent: 6842398 (2005-01-01), Johnson et al.
patent: 6845433 (2005-01-01), Janzen
patent: 6847583 (2005-01-01), Janzen et al.
patent: 6851016 (2005-02-01), Janzen et al.
patent: 6851032 (2005-02-01), LaBerge et al.
patent: 6931483 (2005-08-01), Janzen
patent: 2001/0008005 (2001-07-01), Stevens et al.
patent: 2002/0027795 (2002-03-01), Endo
patent: 2004/0039883 (2004-02-01), LaBerge et al.
patent: 2004/0098528 (2004-05-01), Janzen
patent: 2004/0123196 (2004-06-01), Shidla et al.
patent: 2004/0162935 (2004-08-01), Janzen
patent: 2005/0027959 (2005-02-01), LaBerge et al.
patent: 2005/0094432 (2005-05-01), Johnson et al.
patent: 2006/0036916 (2006-02-01), Janzen

Affiliated with

Also associated with

Rating

Memory with test mode output does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Memory with test mode output, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Memory with test mode output will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4135015