Thin film transistor substrate, liquid crystal display...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S342000, C257S344000, C257S403000, C257SE29278

Reexamination Certificate

active

07619288

ABSTRACT:
A method for manufacturing a thin film transistor substrate includes a step of forming a plurality of island-like semiconductor films above an insulating transparent substrate; a step of forming a gate insulating film on each of the island-like semiconductor films; a step of forming first conductivity type LDD regions on both sides in the first island-like semiconductor film by leaving a channel region and forming a first conductivity type normally-on channel region having an impurity density equivalent to that of the LDD region in the second island-like semiconductor film; a step of forming a first gate electrode partially covering the LDD region and forming a second gate electrode above the normally-on channel region, and a step of forming a first conductivity type source/drain region having an impurity density higher than that of the LDD region in regions on the both sides of the gate electrode.

REFERENCES:
patent: 6104449 (2000-08-01), Takahashi et al.
patent: 6153453 (2000-11-01), Jimenez
patent: 6621125 (2003-09-01), Wang
patent: 6777716 (2004-08-01), Yamazaki et al.
patent: 2004/0191972 (2004-09-01), Hotta
patent: 2004/0206956 (2004-10-01), Yanai et al.
patent: 2005/0007494 (2005-01-01), Yamazaki et al.
patent: 2006/0006425 (2006-01-01), Hotta
patent: 2006/0081852 (2006-04-01), Hotta
patent: 11-068110 (1999-03-01), None
patent: 11-202289 (1999-07-01), None
patent: 2000-010116 (2000-01-01), None
patent: 2005-116838 (2005-04-01), None
International Search Report mailed Aug. 15, 2006.

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