Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2003-12-31
2009-11-03
Louie, Wai-Sing (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S040000, C257S625000, C257S712000, C257SE21521
Reexamination Certificate
active
07612370
ABSTRACT:
An apparatus including an interface having a number of nanostructures is described. The apparatus comprises heat source, a thermal management device, and an interface disposed between the thermal management device and the heat source. The interface a substrate has a number of nanostructures to facilitate heat transfer and adhesion between the heat source and the thermal management device.
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Hannah Eric C.
Kling Ralph M.
Intel Corporation
Louie Wai-Sing
Schwegman Lundberg & Woessner, P.A.
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