Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-06-29
2009-08-18
Smith, Bradley K (Department: 2894)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S342000, C257S328000, C257S135000, C257S339000, C257S329000, C257S493000, C257S492000, C257SE29257, C257SE29262
Reexamination Certificate
active
07576393
ABSTRACT:
A semiconductor device comprises a pillar layer including first semiconductor pillars of a first conduction type and second semiconductor pillars of a second conduction type formed laterally, periodically and alternately. The first and second semiconductor pillars include a plurality of diffusion layers formed in a third semiconductor layer as coupled along the depth. The diffusion layers have lateral widths varied at certain periods along the depth. An average of the lateral widths of the diffusion layers in one certain period is made almost equal to another between different periods.
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Ono Syotaro
Saito Wataru
Belousov Alexander
Kabushiki Kaisha Toshiba
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Smith Bradley K
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