Structure for dual work function metal gate electrodes by...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S371000, C257S372000, C257SE21630, C257SE21625

Reexamination Certificate

active

07612422

ABSTRACT:
Exemplary embodiments provide structures for dual work function metal gate electrodes. The work function value of a metal gate electrode can be increased and/or decreased by disposing various electronegative species and/or electropositive species at the metal/dielectric interface to control interface dipoles. In an exemplary embodiment, various electronegative species can be disposed at the metal/dielectric interface to increase the work function value of the metal, which can be used for a PMOS metal gate electrode in a dual work function gated device. Various electropositive species can be disposed at the metal/dielectric interface to decrease the work function value of the metal, which can be used for an NMOS metal gate electrode in the dual work function gated device.

REFERENCES:
patent: 6274467 (2001-08-01), Gambino et al.
patent: 6936508 (2005-08-01), Visokay et al.
patent: 2006/0115940 (2006-06-01), Kim et al.
patent: 2006/0289953 (2006-12-01), Sakuma et al.
patent: 2007/0272975 (2007-11-01), Schaeffer et al.
patent: 2008/0176368 (2008-07-01), Ichihara et al.

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