Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-06-23
2009-08-18
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
Reexamination Certificate
active
07577930
ABSTRACT:
A method and apparatus for viewing and/or analyzing the operations and logical states of an integrated circuit. The logical state of various flip-flops within the ASIC may be determined at a specified time. The embodiment may store these flip-flop states in a computer-readable data structure, such as a file or database. By repeating this process and incrementing or decrementing the time with each repetition, a more complete picture of the ASIC's operation may be captured. Additionally, the embodiment may graphically display the flip-flop states, for example as a graph or waveform.
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Bailey Robert L.
Howard Brian D.
Apple Inc.
Chiang Jack
Dorsey & Whitney LLP
Memula Suresh
LandOfFree
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