Ferroelectric memory device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257SE27104

Reexamination Certificate

active

07579641

ABSTRACT:
A ferroelectric memory device includes a field effect transistor formed on a semiconductor substrate, an interlayer insulation film formed on the semiconductor substrate so as to cover the field effect transistor, a conductive plug formed in the interlayer insulation film in contact with the first diffusion region, and a ferroelectric capacitor formed over the interlayer insulation in contact with the conductive plug, wherein the ferroelectric capacitor includes a ferroelectric film and upper and lower electrodes sandwiching the ferroelectric film respectively from above and below, the lower electrode being connected electrically to the conductive plug, a layer containing oxygen being interposed between the conductive plug and the lower electrode, a layer containing nitrogen being interposed between the layer containing oxygen and the lower electrode, a self-aligned layer being interposed between the layer containing nitrogen and the lower electrode.

REFERENCES:
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patent: 6992019 (2006-01-01), Lee et al.
patent: 7084076 (2006-08-01), Park et al.
patent: 7504684 (2009-03-01), Kanaya
patent: 2004/0166596 (2004-08-01), Sashida et al.
patent: 2005/0205910 (2005-09-01), Kumura et al.
patent: 2006/0040510 (2006-02-01), Lee et al.
patent: 2008/0073680 (2008-03-01), Wang
patent: 2008/0142915 (2008-06-01), Sashida
patent: 2008/0191254 (2008-08-01), Matsuura
patent: 1480998 (2004-03-01), None
patent: 2004-153031 (2004-05-01), None
Chinese Office Action dated Mar. 28, 2008, issued in corresponding Chinese patent application No. 200610006417.4.

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