Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-10-31
2009-10-27
Parker, Kenneth A (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S296000, C257SE29271
Reexamination Certificate
active
07608898
ABSTRACT:
A one-transistor dynamic random access memory (DRAM) cell includes a transistor which has a first source/drain region, a second source/drain region, a body region between the first and second source/drain regions, and a gate over the body region. The first source/drain region includes a Schottky diode junction with the body region and the second source/drain region includes an n-p diode junction with the body region.
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Burnett James D.
Winstead Brian A.
Budd Paul A
Chiu Joanna G.
Freescale Semiconductor Inc.
Hill Susan C.
Parker Kenneth A
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