Integrated semiconductor memory and method for operating an...

Details Integrated semiconductor memory and method for operating an... Integrated semiconductor memory and method for operating an...

2007-05-09

2008-12-30

Ho, Hoai V (Department: 2827)

Static information storage and retrieval

Read/write circuit

Differential sensing

C365S211000, C365S222000, C365S233100

Reexamination Certificate

active

07471584

ABSTRACT:
An integrated semiconductor memory that has at least one temperature measuring element and repeatedly carries out a temperature measurement during the operation of the semiconductor memory, wherein the semiconductor memory repeats the temperature measurement at instants corresponding to a measuring frequency of the temperature measuring element. According to an embodiment of the invention, the measuring frequency of the temperature measuring element is variable and the temperature measuring element is driven in such a way that the measuring frequency changes in a manner dependent on the temporal development of measured values of the repeated temperature measurements.

REFERENCES:
patent: 6438057 (2002-08-01), Ruckerbauer
patent: 6966693 (2005-11-01), Prakash et al.
patent: 2006/0002217 (2006-01-01), Walker et al.
patent: 2006/0262474 (2006-11-01), Chen et al.
patent: 2007/0001694 (2007-01-01), Jahagirdar et al.
patent: 101 63 306 (2003-04-01), None
patent: WO 2006/014315 (2006-02-01), None

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