Non-volatile memory device and associated method of erasure

Details Non-volatile memory device and associated method of erasure Non-volatile memory device and associated method of erasure

2007-10-12

2008-11-25

Pham, Ly D (Department: 2827)

Static information storage and retrieval

Floating gate

Particular biasing

C365S185110, C365S185160, C365S185170, C365S185180, C365S185220, C365S185290, C365S230030

Reexamination Certificate

active

07457168

ABSTRACT:
Disclosed is a non-volatile memory device and a method of erasing the non-volatile memory device. An erase voltage is simultaneously applied to a plurality of sectors contained in the non-volatile memory device. Then, erase validation is sequentially performed for each of the plurality sectors and results of the erase validation are stored in a plurality of pass information registers. According to the results stored in the pass information registers, sectors which were not successfully erased are simultaneously re-erased and then sequentially re-validated until no such “failed sectors” remain in the non-volatile memory device. Upon eliminating the “failed sectors” from the non-volatile memory device, a post-program operation is sequentially performed on each of the plurality of sectors.

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