Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-09-14
2008-12-23
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07469393
ABSTRACT:
In a verification support device, a logical expression expressing an operation of a pattern generator can be acquired. The pattern generator includes a basic pattern generator, priority pattern generators, priority pattern selection conditions, and selector circuits. The selector circuits connect the basic pattern generator, the priority pattern generators, and the priority pattern selection conditions. Output of the basic pattern generator and outputs of the priority pattern generators are respectively connected to a signal input of a corresponding selector circuit. Outputs of the priority pattern selection conditions are connected to an ON/OFF control input of each selector circuit. An n-th selector circuit, among all selector circuits, is connected to an input terminal of a verification subject.
REFERENCES:
patent: 2002/0138812 (2002-09-01), Johannsen
Jun Yuan et al.; “Constraint Synthesis for Environment Modeling in Functional Verification”; Design Automation Conference 2003; pp. 296-299.
Dinh Paul
Fujitsu Limited
Greer Burns & Crain Ltd.
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