Method of leakage optimization in integrated circuit design

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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Details

C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

07448009

ABSTRACT:
This invention reduces leakage power in an integrated circuit design formed of a plurality of design cells selected from a library of cells. The method of this invention considers all design cells, identifies corresponding candidate cells having the same function and swaps a candidate design cell having a least leakage current for the design cell.

REFERENCES:
patent: 2004/0230924 (2004-11-01), Williams et al.

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