Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-01-03
2008-11-04
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07448009
ABSTRACT:
This invention reduces leakage power in an integrated circuit design formed of a plurality of design cells selected from a library of cells. The method of this invention considers all design cells, identifies corresponding candidate cells having the same function and swaps a candidate design cell having a least leakage current for the design cell.
REFERENCES:
patent: 2004/0230924 (2004-11-01), Williams et al.
Brady W. James
Do Thuan
Marshall, Jr. Robert D.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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