Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate
2006-12-15
2008-12-30
Gulakowski, Randy (Department: 1796)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
C528S033000, C528S034000, C528S037000
Reexamination Certificate
active
07470636
ABSTRACT:
The present invention relates to low a dielectric material essential for a next generation semiconductor with high density and high performance, and more particularly to a low dielectric material that is thermally stable and has good film-forming properties and excellent mechanical properties, a dielectric film comprising the low dielectric material, and a semiconductor device manufactured using the dielectric film. The present invention also provides an organic silicate polymer having a flexible organic bridge unit in the network prepared by the resin composition of the component (a) and the component (b), wherein component (a) is an organosilane of the formula R1mR2nSiX4−m−n(where each of R1and R2which may be the same or different, is a non-hydrolysable group; X is a hydrolysable group; and m and n are integers of from 0 to 3 satisfying 0≦m+n≦3) and/or a partially hydrolyzed condensate thereof and wherein component (b) is an organic bridged silane of the formula R3pY3−pSi-M-SiR4qZ3−q(where each of R3and R4which may be the same or different, is a non-hydrolysable group; each of Y and Z which may be the same or different, is a hydrolysable group; and p and q are integers of from 0 to 2) and/or a cyclic oligomer with organic bridge unit (Si-M-Si).
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Kang Jung-Won
Ko Min-Jin
Moon Myung-Sun
Nam Hye-Yeong
Shin Dong-Seok
Gulakowski Randy
LG Chem Ltd.
Loewe Robert
McKenna Long & Aldridge LLP
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